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XPS and electron transport study of the paramagnetic dusting effect on MgO-based magnetic tunnel junctions
- Authors
- Kim, Dongseok; Kim, Jonghyun; Jung, K. Y.; Jang, Youngjae; Rhie, Kungwon; Lee, B. C.; Joo, Sungjung; Kang, H. J.; Chae, Hong-Chol
- Issue Date
- 9월-2015
- Publisher
- KOREAN PHYSICAL SOC
- Keywords
- CoFeB; FeZr; XPS; MTJ; dusting
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.67, no.5, pp.901 - 905
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY
- Volume
- 67
- Number
- 5
- Start Page
- 901
- End Page
- 905
- ISSN
- 0374-4884
- Abstract
- Amorphous FeZr was dusted in CoFeB/MgO/CoFeB magnetic tunnel junctions (MTJs), and the effects on tunnel phenomena were investigated. As the thickness of the FeZr layer between the CoFeB and the MgO layers increased, the resistance increased rapidly and the bias dependence became asymmetric while the tunneling magneto-resistance (TMR) decreased. The interface was investigated by using X-ray photoemission spectroscopy, and the change in the transport property due to dusting was explained.
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Related Researcher
- Rhie, Kung won
- 과학기술대학 (디스플레이·반도체물리학부 반도체물리전공)