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Fabrication of high-brightness GaN-based light-emitting diodes via thermal nanoimprinting of ZnO-nanoparticle-dispersed resin

Authors
Byeon, Kyeong-JaeCho, Joong-YeonJo, Han-ByeolLee, Heon
Issue Date
15-Aug-2015
Publisher
ELSEVIER
Keywords
emitting diodes (LEDs); Nanoimprint lithography (NIL); ZnO-nanoparticle-dispersed resin (ZNDR); Light extraction efficiency
Citation
APPLIED SURFACE SCIENCE, v.346, pp.354 - 360
Indexed
SCIE
SCOPUS
Journal Title
APPLIED SURFACE SCIENCE
Volume
346
Start Page
354
End Page
360
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/92749
DOI
10.1016/j.apsusc.2015.03.022
ISSN
0169-4332
Abstract
We fabricated high-brightness GaN-based light-emitting diodes (LEDs) with highly refractive patterned structures by using a thermal nanoimprint lithography (NIL). A highly refractive ZnO-nanoparticle-dispersed resin (ZNDR) was used in NIL, and a submicron hole, a submicron high-aspect-ratio pillar, and microconvex arrays were fabricated on the indium tin oxide (ITO) top electrode of GaN-based LED devices. We analyzed the light extraction mechanism for each of the three types of patterns by using a finite element method simulation, and found that the high-aspect-ratio pillar had a great ability to improve light extraction owing to its waveguide effect and prominent scattering effect. As a result, the light output power, which was measured in an integrating sphere, of the LED device was enhanced by up to 19.6% when the high-aspect-ratio pillar array was formed on the top ITO electrode of the device. Further, the electrical properties of none of the patterned LED devices fabricated using ZNDR degraded in comparison to those of bare LED devices. (C) 2015 Elsevier B.V. All rights reserved.
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