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Optimization of transmittance and resistance of indium gallium zinc oxide/Ag/indium gallium zinc oxide multilayer electrodes for photovoltaic devices

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dc.contributor.authorKim, Jun Ho-
dc.contributor.authorLee, Hankyeol-
dc.contributor.authorNa, Jin-Young-
dc.contributor.authorKim, Sun-Kyung-
dc.contributor.authorYoo, Young-Zo-
dc.contributor.authorSeong, Tae-Yeon-
dc.date.accessioned2021-09-04T17:40:39Z-
dc.date.available2021-09-04T17:40:39Z-
dc.date.created2021-06-18-
dc.date.issued2015-04-
dc.identifier.issn1567-1739-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/93956-
dc.description.abstractWe report on the optimization of the optical and electrical properties of IGZO/Ag/IGZO multilayer films as a function of IGZO thickness. The transmission window slightly widened and shifted toward lower energies with increasing IGZO thickness. The IGZO(39 nm)/Ag(19 nm)/IGZO(39 nm) showed transmittance 88.7% at 520 nm. The optical transmittance spectra were examined by finite-difference time-domain (FDTD) simulations. The carrier concentration decreased from 1.73 x 10(22) to 4.99 x 10(21) cm(-3) with increasing the IGZO thickness, while the charge mobility insignificantly changed from 19.07 to 19.62 cm(2)/V. The samples had sheet resistances of 4.17-4.39 Omega/sq with increasing IGZO thickness, while the resistivity increased from 1.89 x 10(-5) to 6.43 x 10(-5) Omega cm. The 39 nm-thick IGZO multilayer sample had a smooth surface with a root mean square roughness of 0.63 nm. The IGZO(39 nm)/Ag(19 nm)/IGZO(39 nm) multilayer showed a Haacke's FOM of 49.94 x 10(-3) Omega(-1). (C) 2015 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectOPTICAL-PROPERTIES-
dc.subjectTRANSPARENT-
dc.subjectCONDUCTOR-
dc.subjectDESIGN-
dc.titleOptimization of transmittance and resistance of indium gallium zinc oxide/Ag/indium gallium zinc oxide multilayer electrodes for photovoltaic devices-
dc.typeArticle-
dc.contributor.affiliatedAuthorSeong, Tae-Yeon-
dc.identifier.doi10.1016/j.cap.2015.02.003-
dc.identifier.scopusid2-s2.0-84922454189-
dc.identifier.wosid000350582900005-
dc.identifier.bibliographicCitationCURRENT APPLIED PHYSICS, v.15, no.4, pp.452 - 455-
dc.relation.isPartOfCURRENT APPLIED PHYSICS-
dc.citation.titleCURRENT APPLIED PHYSICS-
dc.citation.volume15-
dc.citation.number4-
dc.citation.startPage452-
dc.citation.endPage455-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.identifier.kciidART001988705-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusOPTICAL-PROPERTIES-
dc.subject.keywordPlusTRANSPARENT-
dc.subject.keywordPlusCONDUCTOR-
dc.subject.keywordPlusDESIGN-
dc.subject.keywordAuthorIndium gallium zinc oxide-
dc.subject.keywordAuthorAg-
dc.subject.keywordAuthorMultilayer-
dc.subject.keywordAuthorTransparent conducting electrode-
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공과대학 (신소재공학부)
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