Optimization of transmittance and resistance of indium gallium zinc oxide/Ag/indium gallium zinc oxide multilayer electrodes for photovoltaic devices
- Authors
- Kim, Jun Ho; Lee, Hankyeol; Na, Jin-Young; Kim, Sun-Kyung; Yoo, Young-Zo; Seong, Tae-Yeon
- Issue Date
- 4월-2015
- Publisher
- ELSEVIER SCIENCE BV
- Keywords
- Indium gallium zinc oxide; Ag; Multilayer; Transparent conducting electrode
- Citation
- CURRENT APPLIED PHYSICS, v.15, no.4, pp.452 - 455
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- CURRENT APPLIED PHYSICS
- Volume
- 15
- Number
- 4
- Start Page
- 452
- End Page
- 455
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/93956
- DOI
- 10.1016/j.cap.2015.02.003
- ISSN
- 1567-1739
- Abstract
- We report on the optimization of the optical and electrical properties of IGZO/Ag/IGZO multilayer films as a function of IGZO thickness. The transmission window slightly widened and shifted toward lower energies with increasing IGZO thickness. The IGZO(39 nm)/Ag(19 nm)/IGZO(39 nm) showed transmittance 88.7% at 520 nm. The optical transmittance spectra were examined by finite-difference time-domain (FDTD) simulations. The carrier concentration decreased from 1.73 x 10(22) to 4.99 x 10(21) cm(-3) with increasing the IGZO thickness, while the charge mobility insignificantly changed from 19.07 to 19.62 cm(2)/V. The samples had sheet resistances of 4.17-4.39 Omega/sq with increasing IGZO thickness, while the resistivity increased from 1.89 x 10(-5) to 6.43 x 10(-5) Omega cm. The 39 nm-thick IGZO multilayer sample had a smooth surface with a root mean square roughness of 0.63 nm. The IGZO(39 nm)/Ag(19 nm)/IGZO(39 nm) multilayer showed a Haacke's FOM of 49.94 x 10(-3) Omega(-1). (C) 2015 Elsevier B.V. All rights reserved.
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.