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High Performance of Low Band Gap Polymer-Based Ambipolar Transistor Using Single-Layer Graphene Electrodes

Authors
Choi, Jong YongKang, WoonggiKang, BoseokCha, WonsukSon, Seon KyoungYoon, YoungwoonKim, HyunjungKang, YoungjongKo, Min JaeSon, Hae JungCho, KilwonCho, Jeong HoKim, BongSoo
Issue Date
18-3월-2015
Publisher
AMER CHEMICAL SOC
Keywords
ambipolar organic field-effect transistor; single layer graphene electrode; high carrier mobility; low band gap polymer; film crystallinity
Citation
ACS APPLIED MATERIALS & INTERFACES, v.7, no.10, pp.6002 - 6012
Indexed
SCIE
SCOPUS
Journal Title
ACS APPLIED MATERIALS & INTERFACES
Volume
7
Number
10
Start Page
6002
End Page
6012
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/94109
DOI
10.1021/acsami.5b00747
ISSN
1944-8244
Abstract
Bottom-contact bottom-gate organic field-effect transistors (OFETs) are fabricated using a low band gap pDTTDPP-DT polymer as a channel material and single-layer graphene (SLG) or Au source/drain electrodes. The SLG-DaSed ambipolar OFETs significantly outperform the Au-based ambipolar OFETs, and thermal annealing effectively improves the carrier mobilities of the pDTTDPP-DT :films. The difference is attributed to the following facts: (i) the thermally annealed pDTTDPP-DT chains on the SLG assume more crystalline features with an edge-on orientation as compared to the polymer chains on the Au, (ii) the morphological features of the thermally annealed pDTTDPP-DT films on the SLG electrodes are closer to the features of those on the gate dielectric layer, and (iii) the SLG electrode provides a flatter, more hydrophobic surface that is favorable for the polymer crystallization than the Au. In addition, the preferred carrier transport in each electrode-based OFET is associated With the HOMO/LUMO alignment relative to the Fermi level of the employed electrode. All of these "experimental results consistently explain why the carrier mobilities of the SLG-based OFET are more than 10 times higher than those of the Au-based OTFT. This work demonstrates the strong dependence of ambipolar carrier transport on the source/drain electrode and annealing temperature.
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