Compositional homogeneity and X-ray topographic analyses of CdTexSe1-x grown by the vertical Bridgman technique
DC Field | Value | Language |
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dc.contributor.author | Roy, U. N. | - |
dc.contributor.author | Bolotnikov, A. E. | - |
dc.contributor.author | Camarda, G. S. | - |
dc.contributor.author | Cui, Y. | - |
dc.contributor.author | Hossain, A. | - |
dc.contributor.author | Lee, K. | - |
dc.contributor.author | Lee, W. | - |
dc.contributor.author | Tappero, R. | - |
dc.contributor.author | Yang, Ge | - |
dc.contributor.author | Cui, Y. | - |
dc.contributor.author | Burger, A. | - |
dc.contributor.author | James, R. B. | - |
dc.date.accessioned | 2021-09-04T19:27:54Z | - |
dc.date.available | 2021-09-04T19:27:54Z | - |
dc.date.created | 2021-06-15 | - |
dc.date.issued | 2015-02-01 | - |
dc.identifier.issn | 0022-0248 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/94443 | - |
dc.description.abstract | We grew CdTexSe1-x crystals with nominal Se concentrations of 5%, 7%, and 10% by the vertical Bridgman technique, and evaluated their compositional homogeneity and structural quality at the NSLS' X-ray fluorescence and white beam X-ray topography beam lines. Both X-ray fluorescence and photoluminescence mapping revealed very high compositional homogeneity of the CdTexSe1-x crystals. We noted that those crystals with higher concentrations of Se were more prone to twinning than those with a lower content. The crystals were fairly free from strains and contained low concentrations of sub-grain boundaries and their networks. Published by Elsevier B.V. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | CDTE | - |
dc.subject | CRYSTAL | - |
dc.subject | PERFORMANCE | - |
dc.subject | SEGREGATION | - |
dc.subject | DEFECTS | - |
dc.title | Compositional homogeneity and X-ray topographic analyses of CdTexSe1-x grown by the vertical Bridgman technique | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Lee, K. | - |
dc.contributor.affiliatedAuthor | Lee, W. | - |
dc.identifier.doi | 10.1016/j.jcrysgro.2014.10.057 | - |
dc.identifier.scopusid | 2-s2.0-84913582497 | - |
dc.identifier.wosid | 000346857500007 | - |
dc.identifier.bibliographicCitation | JOURNAL OF CRYSTAL GROWTH, v.411, pp.34 - 37 | - |
dc.relation.isPartOf | JOURNAL OF CRYSTAL GROWTH | - |
dc.citation.title | JOURNAL OF CRYSTAL GROWTH | - |
dc.citation.volume | 411 | - |
dc.citation.startPage | 34 | - |
dc.citation.endPage | 37 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Crystallography | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Crystallography | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | CDTE | - |
dc.subject.keywordPlus | CRYSTAL | - |
dc.subject.keywordPlus | PERFORMANCE | - |
dc.subject.keywordPlus | SEGREGATION | - |
dc.subject.keywordPlus | DEFECTS | - |
dc.subject.keywordAuthor | Characterization | - |
dc.subject.keywordAuthor | Defects | - |
dc.subject.keywordAuthor | Te-inclusions | - |
dc.subject.keywordAuthor | Subgrain boundary | - |
dc.subject.keywordAuthor | CdTeSe | - |
dc.subject.keywordAuthor | Semiconducting II-VI materials | - |
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