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Semiconducting behavior of bilayer graphene synthesized by plasma-enhanced chemical vapor deposition and its application in field effect transistors

Authors
Zhao, YuPark, Chang SooFei, Wei DongLee, Cheol Jin
Issue Date
1-12월-2014
Publisher
ELSEVIER SCIENCE BV
Keywords
Graphene; Defects; Semiconducting behavior; Bandgap
Citation
MATERIALS LETTERS, v.136, pp.103 - 106
Indexed
SCIE
SCOPUS
Journal Title
MATERIALS LETTERS
Volume
136
Start Page
103
End Page
106
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/96554
DOI
10.1016/j.matlet.2014.08.028
ISSN
0167-577X
Abstract
We demonstrated the generation of a bandgap in the bilayer graphene synthesized by plasma-enhanced chemical vapor deposition. By adjusting the growth time, the defect density and nano-crystallite size of bilayer graphene were easily controlled, affecting the bandgap of bilayer graphene and the field effect mobility of bilayer graphene field effect transistor (FET). The defect density increased with increasing growth time, whereas the nano-crystallite size decreased. The semiconducting behavior of bilayer graphene was observed by measuring the temperature-dependent conductivity. Defects generated by plasma radiation induce broken symmetry in graphene, thus opening a bandgap. The bandgap energies in the bilayer graphene are 90,156, and 187 meV for growth times of 5, 10, and 30 min, respectively. The back-gate bilayer graphene FET presented the p-type semiconducting behavior and the field effect mobility of approximately 1000 cm(2) V-1 s(-1) when the bandgap energy was 156 meV. (C) 2014 Elsevier B.V. All rights reserved.
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