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Eigen Directional Bit-Planes for Robust Face Recognition

Authors
Lei, LeiKim, Seung-WookPark, Won-JaeKim, Dae-HwanKo, Sung-Jea
Issue Date
Nov-2014
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Face Recognition; Eigen Directional Bit-Plane (EDBP); Local Binary Pattern (LBP); Principal Component Analysis (PCA)
Citation
IEEE TRANSACTIONS ON CONSUMER ELECTRONICS, v.60, no.4, pp.702 - 709
Indexed
SCIE
SCOPUS
Journal Title
IEEE TRANSACTIONS ON CONSUMER ELECTRONICS
Volume
60
Number
4
Start Page
702
End Page
709
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/96928
DOI
10.1109/TCE.2014.7027346
ISSN
0098-3063
Abstract
A visible image-based face recognition system can be seriously degraded in real-life environments by various factors including illumination changes, expression changes, occlusion, and disguise. In this paper, a novel feature descriptor for robust face recognition, Eigen Directional Bit-Plane (EDBP), is introduced to address these issues. It is observed that Local Binary Pattern (LBP) can be decomposed into 8 directional bit-planes (DBP), each of which represents certain directional information of the facial image. Principal Component Analysis (PCA) is then applied to the DBP space to obtain a more compact feature, the EDBP. For face recognition, the proposed EDBP is integrated into conventional state-of-the-art classification methods. Simulation results demonstrate that classifiers with EDBP outperform those with existing feature descriptors under illumination changes, expression changes, occlusion, and disguise(1).
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