Eigen Directional Bit-Planes for Robust Face Recognition
- Authors
- Lei, Lei; Kim, Seung-Wook; Park, Won-Jae; Kim, Dae-Hwan; Ko, Sung-Jea
- Issue Date
- 11월-2014
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- Face Recognition; Eigen Directional Bit-Plane (EDBP); Local Binary Pattern (LBP); Principal Component Analysis (PCA)
- Citation
- IEEE TRANSACTIONS ON CONSUMER ELECTRONICS, v.60, no.4, pp.702 - 709
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE TRANSACTIONS ON CONSUMER ELECTRONICS
- Volume
- 60
- Number
- 4
- Start Page
- 702
- End Page
- 709
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/96928
- DOI
- 10.1109/TCE.2014.7027346
- ISSN
- 0098-3063
- Abstract
- A visible image-based face recognition system can be seriously degraded in real-life environments by various factors including illumination changes, expression changes, occlusion, and disguise. In this paper, a novel feature descriptor for robust face recognition, Eigen Directional Bit-Plane (EDBP), is introduced to address these issues. It is observed that Local Binary Pattern (LBP) can be decomposed into 8 directional bit-planes (DBP), each of which represents certain directional information of the facial image. Principal Component Analysis (PCA) is then applied to the DBP space to obtain a more compact feature, the EDBP. For face recognition, the proposed EDBP is integrated into conventional state-of-the-art classification methods. Simulation results demonstrate that classifiers with EDBP outperform those with existing feature descriptors under illumination changes, expression changes, occlusion, and disguise(1).
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Collections - College of Engineering > School of Electrical Engineering > 1. Journal Articles
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