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Dynamic speckle illumination wide-field reflection phase microscopy

Authors
Choi, YoungwoonHosseini, PooryaChoi, WonshikDasari, Ramachandra R.So, Peter T. C.Yaqoob, Zahid
Issue Date
15-10월-2014
Publisher
OPTICAL SOC AMER
Citation
OPTICS LETTERS, v.39, no.20, pp.6062 - 6065
Indexed
SCIE
SCOPUS
Journal Title
OPTICS LETTERS
Volume
39
Number
20
Start Page
6062
End Page
6065
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/97091
DOI
10.1364/OL.39.006062
ISSN
0146-9592
Abstract
We demonstrate a quantitative reflection-phase microscope based on time-varying speckle-field illumination. Due to the short spatial coherence length of the speckle field, the proposed imaging system features superior lateral resolution, 520 nm, as well as high-depth selectivity, 1.03 mu m. Off-axis interferometric detection enables wide-field and single-shot imaging appropriate for high-speed measurements. In addition, the measured phase sensitivity of this method, which is the smallest measurable axial motion, is more than 40 times higher than that available using a transmission system. We demonstrate the utility of our method by successfully distinguishing the motion of the top surface from that of the bottom in red blood cells. The proposed method will be useful for studying membrane dynamics in complex eukaryotic cells. (C) 2014 Optical Society of America
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