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MEMS-based thin-film solid-oxide fuel cells

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dc.contributor.authorAn, Jihwan-
dc.contributor.authorShim, Joon Hyung-
dc.contributor.authorKim, Young-Beom-
dc.contributor.authorPark, Joong Sun-
dc.contributor.authorLee, Wonyoung-
dc.contributor.authorGuer, Turgut M.-
dc.contributor.authorPrinz, Fritz B.-
dc.date.accessioned2021-09-05T05:42:15Z-
dc.date.available2021-09-05T05:42:15Z-
dc.date.created2021-06-15-
dc.date.issued2014-09-
dc.identifier.issn0883-7694-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/97528-
dc.description.abstractThin-film solid-oxide fuel cells (TF-SOFCs) fabricated using microelectromechanical systems (MEMS) processing techniques not only help lower the cell operating temperature but also provide a convenient platform for studying cathodic losses. Utilizing these platforms, cathode kinetics can be enhanced dramatically by engineering the microstructure of the cathode/electrolyte interface by increasing the surface grain-boundary density. Nanoscale secondary ion mass spectrometry and high-resolution transmission electron microscopy studies have shown that oxygen exchange at electrolyte surface grain boundaries is facilitated by a high population of oxide-ion vacancies segregating preferentially to the grain boundaries. Furthermore, three-dimensional structuring of TF-SOFCs enabled by various lithography methods also helps increase the active surface area and enhance the surface exchange reaction. Although their practical prospects are yet to be verified, MEMS-based TF-SOFC platforms hold the potential to provide high-performance for low-temperature SOFC applications.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherCAMBRIDGE UNIV PRESS-
dc.subjectYTTRIA-STABILIZED ZIRCONIA-
dc.subjectATOMIC LAYER DEPOSITION-
dc.subjectDOPED CERIA INTERLAYERS-
dc.subjectOXYGEN REDUCTION-
dc.subjectBARIUM ZIRCONATE-
dc.subjectGRAIN-BOUNDARY-
dc.subjectELECTROLYTE-
dc.subjectPERFORMANCE-
dc.subjectMEMBRANES-
dc.subjectCATHODES-
dc.titleMEMS-based thin-film solid-oxide fuel cells-
dc.typeArticle-
dc.contributor.affiliatedAuthorShim, Joon Hyung-
dc.identifier.doi10.1557/mrs.2014.171-
dc.identifier.scopusid2-s2.0-84909971907-
dc.identifier.wosid000341995600014-
dc.identifier.bibliographicCitationMRS BULLETIN, v.39, no.9, pp.798 - 804-
dc.relation.isPartOfMRS BULLETIN-
dc.citation.titleMRS BULLETIN-
dc.citation.volume39-
dc.citation.number9-
dc.citation.startPage798-
dc.citation.endPage804-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusYTTRIA-STABILIZED ZIRCONIA-
dc.subject.keywordPlusATOMIC LAYER DEPOSITION-
dc.subject.keywordPlusDOPED CERIA INTERLAYERS-
dc.subject.keywordPlusOXYGEN REDUCTION-
dc.subject.keywordPlusBARIUM ZIRCONATE-
dc.subject.keywordPlusGRAIN-BOUNDARY-
dc.subject.keywordPlusELECTROLYTE-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusMEMBRANES-
dc.subject.keywordPlusCATHODES-
dc.subject.keywordAuthoratomic layer deposition-
dc.subject.keywordAuthorenergy generation-
dc.subject.keywordAuthorGrain boundaries-
dc.subject.keywordAuthornanostructure-
dc.subject.keywordAuthorsecondary ion mass spectroscopy (SIMS)-
dc.subject.keywordAuthortransmission electron microscopy (TEM)-
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