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MEMS-based thin-film solid-oxide fuel cells

Authors
An, JihwanShim, Joon HyungKim, Young-BeomPark, Joong SunLee, WonyoungGuer, Turgut M.Prinz, Fritz B.
Issue Date
9월-2014
Publisher
CAMBRIDGE UNIV PRESS
Keywords
atomic layer deposition; energy generation; Grain boundaries; nanostructure; secondary ion mass spectroscopy (SIMS); transmission electron microscopy (TEM)
Citation
MRS BULLETIN, v.39, no.9, pp.798 - 804
Indexed
SCIE
SCOPUS
Journal Title
MRS BULLETIN
Volume
39
Number
9
Start Page
798
End Page
804
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/97528
DOI
10.1557/mrs.2014.171
ISSN
0883-7694
Abstract
Thin-film solid-oxide fuel cells (TF-SOFCs) fabricated using microelectromechanical systems (MEMS) processing techniques not only help lower the cell operating temperature but also provide a convenient platform for studying cathodic losses. Utilizing these platforms, cathode kinetics can be enhanced dramatically by engineering the microstructure of the cathode/electrolyte interface by increasing the surface grain-boundary density. Nanoscale secondary ion mass spectrometry and high-resolution transmission electron microscopy studies have shown that oxygen exchange at electrolyte surface grain boundaries is facilitated by a high population of oxide-ion vacancies segregating preferentially to the grain boundaries. Furthermore, three-dimensional structuring of TF-SOFCs enabled by various lithography methods also helps increase the active surface area and enhance the surface exchange reaction. Although their practical prospects are yet to be verified, MEMS-based TF-SOFC platforms hold the potential to provide high-performance for low-temperature SOFC applications.
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