Asymmetric Polarization in FE/AFE Bilayer HZO Memcapacitors via Composition-Induced Built-in Bias

  • Kim, Junseok; 
  • Shin, Huiseong; 
  • Park, Hyeonjung; 
  • Han, Changwoo; 
  • Choi, Myeongjae; 
  • ... Shin, Changhwan
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초록

A ferroelectric/antiferroelectric (FE/AFE) bilayer Hf x Zr1-x O2(HZO) memcapacitor was fabricated to investigate asymmetric polarization and capacitance modulation governed by a built-in bias arising from the compositional gradient. This built-in bias facilitates polarization switching under negative bias while significantly suppressing forward switching under positive bias. Furthermore, it stabilizes the negatively poled state, leading to delayed relaxation and forming a wide capacitance memory window. Comparative AC and pulse analyses revealed the coexistence of a fast dipole component and a slow trapped-charge component. The AC read exhibited nonvolatile characteristics, while the pulse read showed volatile behavior with time-dependent charge decay. These differences explain the distinct retention and nondestructive read-out (NDRO) behaviors depending on the measurement scheme. The device demonstrated symmetric, highly linear long-term potentiation and depression, confirming its potential as a synaptic element for next-generation neuromorphic computing.

키워드

ferroelectric/antiferroelectric bilayer; memcapacitor; capacitance memory window; neuromorphic computing; reservoir computing
제목
Asymmetric Polarization in FE/AFE Bilayer HZO Memcapacitors via Composition-Induced Built-in Bias
저자
Kim, Junseok; Shin, Huiseong; Park, Hyeonjung; Han, Changwoo; Choi, Myeongjae; Shin, Changhwan
DOI
10.1021/acsami.5c23738
발행일
2026-03-25
유형
Article
저널명
ACS Applied Materials & Interfaces
권
18
호
11
페이지
16692 ~ 16699