Chen, Yiyu; Atnafu, Ayalneh Dessalegn; Schlattner, Isabella; Weldtsadik, Wendimagegn Tariku; Roh, Myung-Cheol; Kim, Hyoung Joong; Lee, Seong-Whan; Blankertz, Benjamin; Fazli, Siamac
ArticleIssue Date2016CitationIEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY, v.11, no.12, pp.2635 - 2647PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC