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Children and Youth Services Review
ISSN
P 0190-7409 E 1873-7765
출판사
Pergamon Press Ltd.
국가
ENGLAND
발행 상태
활성
데이터베이스 수록 정보
CiteScore 2011-2025 (15년)
JCR 1997-2025 (29년)
Scopus 1979-2026 (48년)
SJR 1999-2020, 2022-2025 (26년)
SSCI 2010-2026 (17년)
전체 9건 중 1번부터 9번까지의 결과를 표시합니다.
2025
Article
Deep Clustering and Regression Ensemble Network for Lot Cycle Time Prediction in Semiconductor Wafer Fabrication
- Song, Beomseok ;
- Song, Seunghwan ;
- Baek, Jun-Geol
- 2025-05
- IEEE Transactions on Semiconductor Manufacturing
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2024
Article
Semantic Segmentation for Noisy and Limited Wafer Transmission Electron Microscope Images
- "Jo, Yongwon ;
- Bae, Jinsoo ;
- Cho, Hansam ;
- Roh, Heejoong ;
- Kim, Kyunghye ;
- ... Kim, Seoung Bum ;
- 외 2명
- 2024-08
- IEEE Transactions on Semiconductor Manufacturing
- Institute of Electrical and Electronics Engineers Inc.
Article
Improving the Reliability of Through Silicon Vias: Reducing Copper Protrusion by Artificial Defect Manipulation and Annealing
- Choi, Won-Jun ;
- Yoo, Myong Jae ;
- Bae, Joonho ;
- Seo, Ji-Hun ;
- Lee, Churl Seung
- 2024-05
- IEEE Transactions on Semiconductor Manufacturing
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2023
Article
SWaCo: Safe Wafer Bin Map Classification With Self-Supervised Contrastive Learning
- Kwak, Min Gu ;
- Lee, Young Jae ;
- Kim, Seoung Bum
- 2023-08
- IEEE Transactions on Semiconductor Manufacturing
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Deep Learning-Based Multi-Horizon Forecasting for Automated Material Handling System Throughput in Semiconductor Fab
- Choi, Jungwoo ;
- Kang, Hyeongwon ;
- Kim, Jeongseob ;
- Choi, Heejeong ;
- Lee, Yunseung ;
- 외 1명
- 2023-02-01
- IEEE Transactions on Semiconductor Manufacturing
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2022
Article
A Hierarchical Spatial-Test Attention Network for Explainable Multiple Wafer Bin Maps Classification
- Do, Hyungrok ;
- Lee, Changhyun ;
- Kim, Seoung Bum
- 2022-02
- IEEE Transactions on Semiconductor Manufacturing
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2021
Article
Dynamic Clustering for Wafer Map Patterns Using Self-Supervised Learning on Convolutional Autoencoders
- Kim, Donghwa ;
- Kang, Pilsung
- 2021-11
- IEEE Transactions on Semiconductor Manufacturing
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Self-Supervised Representation Learning for Wafer Bin Map Defect Pattern Classification
- Kahng, Hyungu ;
- Kim, Seoung Bum
- 2021-02
- IEEE Transactions on Semiconductor Manufacturing
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2018
Article
Practical Routing Algorithm Using a Congestion Monitoring System in Semiconductor Manufacturing
- Lee, Sangmin ;
- Lee, Junho ;
- Na, Byungsoo
- 2018-11
- IEEE Transactions on Semiconductor Manufacturing
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC