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Livestock Science
ISSN
P 1871-1413 E 1878-0490
출판사
Elsevier BV
국가
NETHERLANDS
발행 상태
활성
데이터베이스 수록 정보
CiteScore 2011-2025 (15년)
EMBASE 2020-2026 (7년)
JCR 2006-2025 (20년)
SCI 2010-2019 (10년)
SCIE 2010-2026 (17년)
Scopus 2006-2026 (21년)
SJR 1999-2020, 2022-2025 (26년)
전체 13건 중 1번부터 10번까지의 결과를 표시합니다.
2022
Article
Performance analysis of coloured BIPV systems depending on reliability of irradiance data
- Jeong, Sookyung ;
- Jang, Juhee ;
- Park, Indoo ;
- Jo, Sun keun ;
- Lim, Jungtek ;
- ... Lee, Hae-seok ;
- 외 2명
- 2022-11
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2021
Article
Analysis of the impact of power loss due to snail trails in a 95-kWp photovoltaic power system
- Oh, Wonwook ;
- Choi, Hoonjoo ;
- Kim, Donghwan
- 2021-11
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2020
Article
Evaluation based on performance and failure of PV system in 10 years field-aged 1 MW PV power plant
- Oh, Wonwook ;
- Choi, Hoonjoo ;
- Seo, Kun Won ;
- Kim, Daesung ;
- Kim, So-Yeon ;
- ... Lee, Hae-Seok ;
- 외 2명
- 2020-11
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2019
Article
Analysis of degradation in 25-year-old field-aged crystalline silicon solar cells
- Oh, Wonwook ;
- Bae, Soohyun ;
- Kim, Seongtak ;
- Park, Nochang ;
- Chan, Sung-Il ;
- 외 3명
- 2019-09
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2018
Article
Initial detection of potential-induced degradation using dark I-V characteristics of crystalline silicon photovoltaic modules in the outdoors
- Oh, Wonwook ;
- Bae, Soohyun ;
- Kim, Donghwan ;
- Park, Nochang
- 2018-09
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2017
Article
Field degradation prediction of potential induced degradation of the crystalline silicon photovoltaic modules based on accelerated test and climatic data
- Oh, Wonwook ;
- Bae, Soohyun ;
- Chan, Sung-Il ;
- Lee, Hae-Seok ;
- Kim, Donghwan ;
- 외 1명
- 2017-09
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2016
Article
Evaluation of potential-induced degradation in crystalline Si solar cells using Na fault injection
- Oh, Wonwook ;
- Kim, Junhee ;
- Kang, Byungjun ;
- Bae, Soohyun ;
- Lee, Kyung Dong ;
- ... Lee, Hae-Seok ;
- 외 2명
- 2016-09
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2014
Article
The degradation of multi-crystalline silicon solar cells after damp heat tests
- Oh, Wonwook ;
- Kim, Seongtak ;
- Bae, Soohyun ;
- Park, Nochang ;
- Kang, Yoonmook ;
- 외 2명
- 2014-09
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2013
Article
Effect of moisture condensation on long-term reliability of crystalline silicon photovoltaic modules
- Park, Nochang ;
- Han, Changwoon ;
- Kim, Donghwan
- 2013-12
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2012
Article
Improved reliability of copper-cored solder joints under a harsh thermal cycling condition
- Kim, Yunsung ;
- Choi, Hyelim ;
- Lee, Hyoungjoo ;
- Shin, Dongjun ;
- Cho, Jinhan ;
- 외 1명
- 2012-07
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
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