유현용 프로필 사진

유현용

Yu, Hyun Yong

공과대학

전기전자공학부

자료 필터

자료유형

발행연도

2012 ~ 2026
2012 2026

키워드

언어

선택된 필터

  • article
  • conference
  • book

전체 109건 중 81번부터 90번까지의 결과를 표시합니다.

2016
Article

Effect of Hydrogen Annealing on Contact Resistance Reduction of Metal-Interlayer-n-Germanium Source/Drain Structure

  • Kim, Gwang-Sik ; 
  • Yoo, Gwangwe ; 
  • Seo, Yujin ; 
  • Kim, Seung-Hwan ; 
  • Cho, Karam ; 
  • ... Yu, Hyun-Yong ; 
  • 외 3명
  • 2016-06
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Effect of Metal Nitride on Contact Resistivity of Metal-Interlayer-Ge Source/Drain in Sub-10-nm n-Type Ge FinFET

  • Ahn, Juhan ; 
  • Kim, Jeong-Kyu ; 
  • Kim, Sun-Woo ; 
  • Kim, Gwang-Sik ; 
  • Shin, Changhwan ; 
  • ... Kim, Jong-Kook ; 
  • ... Yu, Hyun-Yong ; 
  • 외 1명
  • 2016-06
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Threshold voltage variation-immune FinFET design with metal-interlayer-semiconductor source/drain structure

  • 2016-06
  • Current Applied Physics
  • ELSEVIER
Article

Non-Alloyed Ohmic Contacts on GaAs Using Metal-Interlayer-Semiconductor Structure With SF6 Plasma Treatment

  • Kim, Seung-Hwan ; 
  • Kim, Gwang-Sik ; 
  • Kim, Sun-Woo ; 
  • Kim, Jeong-Kyu ; 
  • Choi, Changhwan ; 
  • ... Yu, Hyun-Yong ; 
  • 외 2명
  • 2016-04
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Extremely Low Contact Resistance on Graphene through n-Type Doping and Edge Contact Design

  • Park, Hyung-Youl ; 
  • Jung, Woo-Shik ; 
  • Kang, Dong-Ho ; 
  • Jeon, Jaeho ; 
  • Yoo, Gwangwe ; 
  • ... Yu, Hyun-Yong ; 
  • 외 8명
  • 2016-02-03
  • Advanced Materials
  • WILEY-V C H VERLAG GMBH
Article

Theoretical and Experimental Investigation of Graphene/High-kappa/p-Si Junctions

  • Shim, Jaewoo ; 
  • Yoo, Gwangwe ; 
  • Kang, Dong-Ho ; 
  • Jung, Woo-Shik ; 
  • Byun, Young-Chul ; 
  • ... Yu, Hyun-Yong ; 
  • 외 5명
  • 2016-01
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2015
Article

Remote plasma atomic layer deposited Al2O3 4H SiC MOS capacitor with remote H-2 plasma passivation and post metallization annealing

  • Heo, Seung Chan ; 
  • Lim, Donghwan ; 
  • Jung, Woo Suk ; 
  • Choi, Rino ; 
  • Yu, Hyun-Yong ; 
  • 외 1명
  • 2015-11-01
  • Microelectronic Engineering
  • ELSEVIER
Article

The Mechanism of Schottky Barrier Modulation of Tantalum Nitride/Ge Contacts

  • Seo, Yujin ; 
  • Lee, Sukwon ; 
  • Baek, Seung-heon Chris ; 
  • Hwang, Wan Sik ; 
  • Yu, Hyun-Yong ; 
  • 외 2명
  • 2015-10
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Fermi-Level Unpinning Using a Ge-Passivated Metal-Interlayer-Semiconductor Structure for Non-Alloyed Ohmic Contact of High-Electron-Mobility Transistors

  • Kim, Seung-Hwan ; 
  • Kim, Gwang-Sik ; 
  • Kim, Jeong-Kyu ; 
  • Park, Jin-Hong ; 
  • Shin, Changhwan ; 
  • ... Yu, Hyun-Yong ; 
  • 외 1명
  • 2015-09
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Surface Passivation of Germanium Using SF6 Plasma to Reduce Source/Drain Contact Resistance in Germanium n-FET

  • Kim, Gwang-Sik ; 
  • Kim, Seung-Hwan ; 
  • Kim, Jeong-Kyu ; 
  • Shin, Changhwan ; 
  • Park, Jin-Hong ; 
  • ... Yu, Hyun-Yong ; 
  • 외 2명
  • 2015-08
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC