김태근 프로필 사진

김태근

Kim, Tae geun

공과대학

전기전자공학부

자료 필터

자료유형

발행연도

2008 ~ 2026
2008 2026

키워드

언어

선택된 필터

  • article
  • conference
  • book

전체 450건 중 191번부터 200번까지의 결과를 표시합니다.

2013
Article

Resistive switching characteristics of sol-gel based ZnO nanorods fabricated on flexible substrates

  • Park, Soyun ; 
  • Lee, Jae Hyuk ; 
  • Kim, Hee-Dong ; 
  • Hong, Seok Man ; 
  • An, Ho-Myoung ; 
  • ... Kim, Tae Geun
  • 2013-07
  • physica status solidi (RRL) - Rapid Research Letters
  • WILEY-V C H VERLAG GMBH
Article

Improved reliability of Ti/ZrN/Pt resistive switching memory cells using hydrogen postannealing

  • Kim, Hee-Dong ; 
  • Yun, Min Ju ; 
  • Hong, Seok Man ; 
  • An, Ho-Myoung ; 
  • Kim, Tae Geun
  • 2013-07
  • Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
  • A V S AMER INST PHYSICS
Article

Bias temperature instability analysis on memory properties improved by hydrogen annealing treatment in Ti/HfOx/Pt capacitors

  • Kim, Hee-Dong ; 
  • Yun, Min Ju ; 
  • Hong, Seok Man ; 
  • An, Ho-Myoung ; 
  • Kim, Tae Geun
  • 2013-07
  • physica status solidi (RRL) - Rapid Research Letters
  • WILEY-V C H VERLAG GMBH
Article

Analysis of electrical properties and deep level defects in undoped GaN Schottky barrier diode

  • Peta, Koteswara Rao ; 
  • Park, Byung-Guon ; 
  • Lee, Sang-Tae ; 
  • Kim, Moon-Deock ; 
  • Oh, Jae-Eung ; 
  • ... Kim, Tae-Geun ; 
  • 외 1명
  • 2013-05-01
  • Thin Solid Films
  • ELSEVIER SCIENCE SA
Article

A Four-Bit-Per-Cell Program Method with Substrate-Bias Assisted Hot Electron Injection for Charge Trap Flash Memory Devices

  • An, Ho-Myoung ; 
  • Kim, Hee-Dong ; 
  • Kim, Byungcheul ; 
  • Kim, Tae Geun
  • 2013-05
  • Journal of Nanoscience and Nanotechnology
  • AMER SCIENTIFIC PUBLISHERS
Article

Improved Thermal Stability and Reduced Contact Resistance of Ohmic Contacts on N-Face n-Type GaN With Laser-Assisted Doping

  • 2013-03
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Bipolar Resistive-Switching Phenomena and Resistive-Switching Mechanisms Observed in Zirconium Nitride-Based Resistive-Switching Memory Cells

  • 2013-03
  • IEEE Transactions on Device and Materials Reliability
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Numerical Study of Enhanced Performance in InGaN Light-Emitting Diodes with Graded-composition AlGaInN Barriers

  • 2013-02
  • Journal of the Optical Society of Korea
  • OPTICAL SOC KOREA
Article

A CMOS-Process-Compatible ZnO-Based Charge-Trap Flash Memory

  • Seo, Yujeong ; 
  • Song, Min Yeong ; 
  • An, Ho-Myoung ; 
  • Kim, Tae Geun
  • 2013-02
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC