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Quantitative scanning thermal microscopy using double scan technique

Kim, Kyeongtae; Chung, Jaehoon; Won, Jongbo; Kwon, Ohmyoung; Lee, Joon Sik; Park, Seung Ho; Choi, Young Ki

ArticleIssue Date2008CitationAPPLIED PHYSICS LETTERS, v.93, no.20PublisherAMER INST PHYSICS
1
STATISTICS
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