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Quantitative scanning thermal microscopy using double scan technique

Authors
Kim, KyeongtaeChung, JaehoonWon, JongboKwon, OhmyoungLee, Joon SikPark, Seung HoChoi, Young Ki
Issue Date
17-11월-2008
Publisher
AMER INST PHYSICS
Keywords
heat transfer; temperature measurement
Citation
APPLIED PHYSICS LETTERS, v.93, no.20
Indexed
SCIE
SCOPUS
Journal Title
APPLIED PHYSICS LETTERS
Volume
93
Number
20
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/122397
DOI
10.1063/1.3033545
ISSN
0003-6951
Abstract
Although scanning thermal microscope has shown the highest spatial resolution in local temperature and thermophysical property measurement, its usefulness has been severely limited due to difficulties in quantitative measurement. We propose a double scan technique that measures temperature only from the heat transfer through the tip-sample contact by the subtraction of the signal due to the heat transfer through the air. A rigorous theoretical model for this technique is derived. The effectiveness of the double scan technique in quantitative temperature measurement is demonstrated experimentally.
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공과대학 (기계공학부)
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