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Silicon-based metallic micro grid for electron field emission

Authors
Kim, JaehongJeon, Seok-GyKim, Jung-IlKim, Geun-JuHeo, DuchangShin, Dong HoonSun, YuningLee, Cheol Jin
Issue Date
Oct-2012
Publisher
IOP PUBLISHING LTD
Citation
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, v.22, no.10
Indexed
SCIE
SCOPUS
Journal Title
JOURNAL OF MICROMECHANICS AND MICROENGINEERING
Volume
22
Number
10
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/107256
DOI
10.1088/0960-1317/22/10/105009
ISSN
0960-1317
Abstract
A micro-scale metal grid based on a silicon frame for application to electron field emission devices is introduced and experimentally demonstrated. A silicon lattice containing aperture holes with an area of 80 x 80 mu m(2) and a thickness of 10 mu m is precisely manufactured by dry etching the silicon on one side of a double-polished silicon wafer and by wet etching the opposite side. Because a silicon lattice is more rigid than a pure metal lattice, a thin layer of Au/Ti deposited on the silicon lattice for voltage application can be more resistant to the geometric stress caused by the applied electric field. The micro-fabrication process, the images of the fabricated grid with 88% geometric transparency and the surface profile measurement after thermal feasibility testing up to 700 degrees C are presented.
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