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A new method for evaluating postacne scarring
- Authors
- Lee, Jin Woong; Kim, Beom Joon; Kim, Myeung Nam; Choi, Young-Hwan; Kim, Kyungrok; Hwang, Eenjun
- Issue Date
- Aug-2012
- Publisher
- WILEY-BLACKWELL
- Citation
- SKIN RESEARCH AND TECHNOLOGY, v.18, no.3, pp.384 - 385
- Indexed
- SCIE
SCOPUS
- Journal Title
- SKIN RESEARCH AND TECHNOLOGY
- Volume
- 18
- Number
- 3
- Start Page
- 384
- End Page
- 385
- ISSN
- 0909-752X
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > School of Electrical Engineering > 1. Journal Articles
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Related Researcher
- Hwang, Een jun
- College of Engineering (School of Electrical Engineering)