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Fabrication of SiNx-based photonic crystals on GaN-based LED devices with patterned sapphire substrate by nanoimprint lithography

Authors
Byeon, Kyeong-JaeCho, Joong-YeonKim, JinseungPark, HyoungwonLee, Heon
Issue Date
7-5월-2012
Publisher
OPTICAL SOC AMER
Citation
OPTICS EXPRESS, v.20, no.10, pp.11423 - 11432
Indexed
SCIE
SCOPUS
Journal Title
OPTICS EXPRESS
Volume
20
Number
10
Start Page
11423
End Page
11432
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/108440
DOI
10.1364/OE.20.011423
ISSN
1094-4087
Abstract
SiNx-based photonic crystal (PhC) patterns were fabricated on the ITO electrode layer of a GaN-based light-emitting diode (LED) device on a patterned sapphire substrate (PSS) by a UV nanoimprint lithography process in order to improve the light extraction of the device. A three-dimensional finite-difference time-domain simulation confirmed that the light extraction of a GaN LED structure on a PSS is enhanced when SiNx PhC patterns are formed on the ITO top layer. From the I-V characteristics, the electrical properties of patterned LED devices with SiNx-based PhC were not degraded compared to the unpatterned LED device, since plasma etching of the p-GaN or the ITO layers was not involved in the patterning process. Additionally, the patterned LED devices with SiNx-based PhCs showed 19%-increased electroluminescence intensity compared with the unpatterned LED device at 445 nm wavelength when a 20 mA current is driven. (C) 2012 Optical Society of America
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