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PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration

Authors
Kim, Moo-YoungLee, HokyuKim, Chulwoo
Issue Date
Apr-2012
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
All digital gates; current source; on-chip; process, supply voltage, and temperature (PVT) detector; self-calibration
Citation
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.20, no.4, pp.737 - 741
Indexed
SCIE
SCOPUS
Journal Title
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Volume
20
Number
4
Start Page
737
End Page
741
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/108880
DOI
10.1109/TVLSI.2011.2109971
ISSN
1063-8210
Abstract
A current source with a small current error has been proposed to maintain the bandwidth of the system without an increase in power consumption for a margin. It minimizes the current error under process, supply voltage, and temperature (PVT) variations. Because the on-resistance of the nMOS array is self-calibrated digitally by an on-chip digital PVT detector, a current error of only +/- 2% is achieved. The current source has been implemented in an 80-nm CMOS process, occupies 0.018 mm(2) and consumes 94.9 mu W at a supply voltage of 1.0 V.
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