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Enhancement of measurement sensitivity of polarization holographic microscopyEnhancement of measurement sensitivity of polarization holographic microscopy
- Alternative Title
- Enhancement of measurement sensitivity of polarization holographic microscopy
- Authors
- Kim, Beop-Min
- Issue Date
- 15-7월-2019
- Publisher
- 한국광학회
- Citation
- The 30th Anniversary of the Optical Society of Korea Optics and Photonics Congress 2019
- Conference Name
- The 30th Anniversary of the Optical Society of Korea Optics and Photonics Congress 2019
- Place
- KO
- Conference Date
- 2019-07-14
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Collections - Graduate School > Department of Bioengineering > 2. Conference Papers
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