Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Analysis of light trapping effects in Si solar cells with a textured surface by ray tracing simulation

Authors
Byun, Seok-JooByun, Seok YongLee, JangkyoKim, Jae WanLee, Taek SungCho, KyumanSheen, DongwooTark, Sung JuKim, DonghwanKim, Won Mok
Issue Date
7월-2011
Publisher
ELSEVIER SCIENCE BV
Keywords
Ray tracing; Si solar cell; Texture; Etching
Citation
CURRENT APPLIED PHYSICS, v.11, no.4, pp.S23 - S25
Indexed
SCIE
SCOPUS
KCI
Journal Title
CURRENT APPLIED PHYSICS
Volume
11
Number
4
Start Page
S23
End Page
S25
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/112061
DOI
10.1016/j.cap.2011.01.048
ISSN
1567-1739
Abstract
The effects of the size and density of a pyramidal texture, as formed on the surface of Si solar cells to increase the light trapping efficiency, on the optical reflectance and absorptance were examined by comparing simulation results and experimental observations. A ray tracing algorithm capable of the direct calculation of the absorbed energy in active Si was utilized for the simulation. The simulation results showed that the optical reflectance spectra, i.e., the absorptances, of the textured surface with a fixed density of pyramids were not affected by the pyramid pitch, whereas the spectra with varying density of pyramids decreased with an increase in the density of the pyramids. Observations similar to the simulation results were observed from the experimentally textured surfaces, indicating that the density of the pyramid area, i.e., the area of the flat region, is the most crucial factor affecting the optical behavior of a textured Si surface with three-dimensional pyramid patterns. (C) 2011 Elsevier B.V. All rights reserved.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher KIM, Dong hwan photo

KIM, Dong hwan
공과대학 (신소재공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE