Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Investigation of the Cause of a Malfunction in a Display Package and Its Solution

Authors
Kim, Jae ChoonLee, Dong JinHwang, Sung WooJu, Byeong-KwonYun, Sang KyeongPark, Heung-WooChung, Jin Taek
Issue Date
1월-2011
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Deformable mirror arrays; micro-beam projector; temperature control
Citation
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.1, no.1, pp.119 - 124
Indexed
SCIE
SCOPUS
Journal Title
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY
Volume
1
Number
1
Start Page
119
End Page
124
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/113308
DOI
10.1109/TCPMT.2010.2099910
ISSN
2156-3950
Abstract
A piezo-actuated display package (PADP) with deformable mirror arrays is proposed for handheld applications of a micro-beam projection display. Temperature change is a critical factor affecting the performance of a PADP. To analyze temperature-related malfunctions, electrical, mechanical, and thermal analyses of the package are conducted simultaneously. A temperature control system using a micro-heater is developed to maintain the deformable mirror module at a constant temperature. Numerical results are used to determine the relationship between displacement and the temperature of the deformable mirrors. Experimental results are used to elucidate the relationship between the source image data and the temperature of the deformable mirror module. A micro-beam projector with a temperature control system is used to produce high quality images under various ambient temperatures.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electrical Engineering > 1. Journal Articles
College of Engineering > School of Electrical Engineering > 1. Journal Articles
College of Engineering > Department of Mechanical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Ju, Byeong kwon photo

Ju, Byeong kwon
공과대학 (전기전자공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE