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Quantitative Two-Dimensional Nanoscale Simultaneous Mapping of Temperature and Thermal Conductivity: Vacuum Null Point Scanning Thermal MicroscopyQuantitative Two-Dimensional Nanoscale Simultaneous Mapping of Temperature and Thermal Conductivity: Vacuum Null Point Scanning Thermal Microscopy
- Alternative Title
- Quantitative Two-Dimensional Nanoscale Simultaneous Mapping of Temperature and Thermal Conductivity: Vacuum Null Point Scanning Thermal Microscopy
- Authors
- KWON, Oh Myoung
- Issue Date
- 1-7월-2019
- Publisher
- the korean institute of metals and materials and korea thermoelectric society
- Citation
- the 38th international conference on thermoelectrics
- Conference Name
- the 38th international conference on thermoelectrics
- Place
- KO
경주(화백 국제컨벤션 센터)
- Conference Date
- 2019-06-30
- Files in This Item
- There are no files associated with this item.
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Collections - College of Engineering > Department of Mechanical Engineering > 2. Conference Papers
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