Maskless optical microscope lithography system
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Eung Seok | - |
dc.contributor.author | Jang, Doyoung | - |
dc.contributor.author | Lee, Jaewoo | - |
dc.contributor.author | Kim, Yun Jeong | - |
dc.contributor.author | Na, Junhong | - |
dc.contributor.author | Ji, Hyunjin | - |
dc.contributor.author | Choi, Jae Wan | - |
dc.contributor.author | Kim, Gyu-Tae | - |
dc.date.accessioned | 2021-09-08T10:57:06Z | - |
dc.date.available | 2021-09-08T10:57:06Z | - |
dc.date.created | 2021-06-11 | - |
dc.date.issued | 2009-12 | - |
dc.identifier.issn | 0034-6748 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/118789 | - |
dc.description.abstract | A simple maskless photolithography system employing an optical microscope, a motorized stage and a beam blanker is proposed. Based on a pattern design, the motorized stage shifts a resist-coated substrate exposed by a focused beam under a microscope. Microscale patterns are easily defined on a single nanowire without using a mask validating the application applying to the research requiring frequent changes or free-style designs in microscale test patterns. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3266965] | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Maskless optical microscope lithography system | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Lee, Jaewoo | - |
dc.contributor.affiliatedAuthor | Kim, Gyu-Tae | - |
dc.identifier.doi | 10.1063/1.3266965 | - |
dc.identifier.scopusid | 2-s2.0-73849139998 | - |
dc.identifier.wosid | 000273217300053 | - |
dc.identifier.bibliographicCitation | REVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.12 | - |
dc.relation.isPartOf | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
dc.citation.title | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
dc.citation.volume | 80 | - |
dc.citation.number | 12 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
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