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Maskless optical microscope lithography system

Authors
Park, Eung SeokJang, DoyoungLee, JaewooKim, Yun JeongNa, JunhongJi, HyunjinChoi, Jae WanKim, Gyu-Tae
Issue Date
12월-2009
Publisher
AMER INST PHYSICS
Citation
REVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.12
Indexed
SCIE
SCOPUS
Journal Title
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume
80
Number
12
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/118789
DOI
10.1063/1.3266965
ISSN
0034-6748
Abstract
A simple maskless photolithography system employing an optical microscope, a motorized stage and a beam blanker is proposed. Based on a pattern design, the motorized stage shifts a resist-coated substrate exposed by a focused beam under a microscope. Microscale patterns are easily defined on a single nanowire without using a mask validating the application applying to the research requiring frequent changes or free-style designs in microscale test patterns. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3266965]
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Graduate School > Department of Electronics and Information Engineering > 1. Journal Articles
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Kim, Gyu Tae
공과대학 (전기전자공학부)
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