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Impurity scattering effects on transport through gate-all-around Si nanowires

Authors
Oh, Jung HyunAhn, D.Hwang, S. W.Hwang, J. S.Son, M. H.
Issue Date
3월-2008
Publisher
ELSEVIER
Keywords
nanowire transistor; Green' s function; impurity scattering
Citation
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, v.40, no.5, pp.1526 - 1529
Indexed
SCIE
SCOPUS
Journal Title
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES
Volume
40
Number
5
Start Page
1526
End Page
1529
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/123923
DOI
10.1016/j.physe.2007.09.080
ISSN
1386-9477
Abstract
We investigate effects of impurity scattering on current-voltage characteristics in a gate-all-around Si nanowire theoretically. Using non-equilibrium. Green's function technique, the self-energy for the impurity scattering is incorporated under the self-consistent Born approximation. We show that the impurity scattering changes the electronic structure of the Si nanowire largely and, thus, results in very different current-voltage curves compared to the case of the free-impurity scattering. (C) 2007 Published by Elsevier B.V.
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