Impurity scattering effects on transport through gate-all-around Si nanowires
- Authors
- Oh, Jung Hyun; Ahn, D.; Hwang, S. W.; Hwang, J. S.; Son, M. H.
- Issue Date
- 3월-2008
- Publisher
- ELSEVIER
- Keywords
- nanowire transistor; Green' s function; impurity scattering
- Citation
- PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, v.40, no.5, pp.1526 - 1529
- Indexed
- SCIE
SCOPUS
- Journal Title
- PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES
- Volume
- 40
- Number
- 5
- Start Page
- 1526
- End Page
- 1529
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/123923
- DOI
- 10.1016/j.physe.2007.09.080
- ISSN
- 1386-9477
- Abstract
- We investigate effects of impurity scattering on current-voltage characteristics in a gate-all-around Si nanowire theoretically. Using non-equilibrium. Green's function technique, the self-energy for the impurity scattering is incorporated under the self-consistent Born approximation. We show that the impurity scattering changes the electronic structure of the Si nanowire largely and, thus, results in very different current-voltage curves compared to the case of the free-impurity scattering. (C) 2007 Published by Elsevier B.V.
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