Hyperthermal neutral beam sources for material processing (invited)
- Authors
- Yoo, S. J.; Kim, D. C.; Joung, M.; Kim, J. S.; Lee, B. J.; Oh, K. S.; Kim, K. U.; Kim, Y. H.; Kim, Y. W.; Choi, S. W.; Son, H. J.; Park, Y. C.; Jang, J. -N.; Hong, M. P.
- Issue Date
- 2월-2008
- Publisher
- AMER INST PHYSICS
- Keywords
- plasma induced damage; hyperthermal neutral beam
- Citation
- REVIEW OF SCIENTIFIC INSTRUMENTS, v.79, no.2
- Indexed
- SCIE
SCOPUS
- Journal Title
- REVIEW OF SCIENTIFIC INSTRUMENTS
- Volume
- 79
- Number
- 2
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/124117
- DOI
- 10.1063/1.2801343
- ISSN
- 0034-6748
- Abstract
- Hyperthermal neutral beams have a great potential for material processes, especially for etching and thin film deposition for semiconductor and display fabrication as well as deposition for various thin film applications. Plasma-induced damage during plasma etching is a serious problem for manufacturing deep submicron semiconductor devices and is expected to be a problem for future nanoscale devices. Thermal and plasma-induced damage is also problematic for thin film depositions such as transparent conductive oxide films on organic light emitting diodes or flexible displays due to high temperature processes in plasma environments. These problems can be overcome by damage-free and low-temperature processes with hyperthermal neutral beams. We will present the status of the hyperthermal neutral beam development and the applications, especially, in semiconductor and display fabrication and introduce potential applications of thin film growing for optoelectronic devices such as light emitting diodes. (C) 2008 American Institute of Physics.
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- Appears in
Collections - Graduate School > Department of Applied Physics > 1. Journal Articles
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