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MC2NN: Wafer Lot 3D Classification Using Marching Cubes Convolutional Neural NetworksMC2NN: Wafer Lot 3D Classification Using Marching Cubes Convolutional Neural Networks

Alternative Title
MC2NN: Wafer Lot 3D Classification Using Marching Cubes Convolutional Neural Networks
Authors
Jun-Geol Baek
Issue Date
21-7월-2021
Publisher
KSPE
Citation
International Symposium on Precision Engineering and Sustainable Manufacturing (PRESM 2021)
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/126773
Conference Name
International Symposium on Precision Engineering and Sustainable Manufacturing (PRESM 2021)
Place
KO
Jeju, Korea
Conference Date
2021-07-21
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College of Engineering > School of Industrial and Management Engineering > 2. Conference Papers

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공과대학 (산업경영공학부)
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