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Contrastive CNN for Mixed-type Pattern Recognition with Single-type Pattern on Wafer Bin MapsContrastive CNN for Mixed-type Pattern Recognition with Single-type Pattern on Wafer Bin Maps
- Alternative Title
- Contrastive CNN for Mixed-type Pattern Recognition with Single-type Pattern on Wafer Bin Maps
- Authors
- Jun-Geol Baek
- Issue Date
- 14-7월-2021
- Publisher
- EURO
- Citation
- 31st European Conference on Operational Research (EURO 2021)
- Conference Name
- 31st European Conference on Operational Research (EURO 2021)
- Place
- GR
Athens, Greece
- Conference Date
- 2021-07-11
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