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eRAD-Fe: Emotion Recognition-Assisted Deep Learning Framework

Authors
Kim, Sun-HeeNgoc Anh Thi NguyenYang, Hyung-JeongLee, Seong-Whan
Issue Date
2021
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Deep learning; electroencephalogram; emotion recognition; energy threshold; feature extraction; long short-term memory; multiclass common spatial pattern (CSP)
Citation
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.70
Indexed
SCIE
SCOPUS
Journal Title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume
70
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/138665
DOI
10.1109/TIM.2021.3115195
ISSN
0018-9456
Abstract
With recent advancements in artificial intelligence technologies and human-computer interaction, strategies to identify the inner emotional states of humans through physiological signals such as electroencephalography (EEG) have been actively investigated and applied in various fields. Thus, there is an increasing demand for emotion analysis and recognition via EEG signals in real time. In this article, we proposed a new framework, emotion recognition-assisted deep learning framework from eeg signal (eRAD-Fe), to achieve the best recognition result from EEG signals. eRAD-Fe integrates three aspects by exploiting sliding-window segmentation method to enlarge the size of the training dataset, configuring the energy threshold-based multiclass common spatial patterns to extract the prominent features, and improving emotional state recognition performance based on a long short-term memory model. With our proposed recognitionassisted framework, the emotional classification accuracies were 82%, 72%, and 81% on three publicly available EEG datasets, such as SEED, DEAP, and DREAMER, respectively.
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