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Mechanism of Low Frequency Noise and Trap Density Profile in Dual Gate Metal Oxide Thin Film TransistorMechanism of Low Frequency Noise and Trap Density Profile in Dual Gate Metal Oxide Thin Film Transistor
- Alternative Title
- Mechanism of Low Frequency Noise and Trap Density Profile in Dual Gate Metal Oxide Thin Film Transistor
- Authors
- LEE Jae Woo
- Issue Date
- 25-8월-2021
- Publisher
- Korea Information Display
- Citation
- 22nd International Meeting on Information Display (IMID 2022)
- Conference Name
- 22nd International Meeting on Information Display (IMID 2022)
- Place
- KO
- Conference Date
- 2021-08-25
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