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Electrochemical modulation of trap states in PbS QDs and their electrical characterizationElectrochemical modulation of trap states in PbS QDs and their electrical characterization

Other Titles
Electrochemical modulation of trap states in PbS QDs and their electrical characterization
Authors
Jin, JunyoungPark, Tae HwanSeong, Tae-YeonHwang, Gyu Weon
Issue Date
Jul-2022
Publisher
KOREAN PHYSICAL SOC
Keywords
Lead sulfide; Quantum dot; Cyclic voltammetry; Trap passivation; Thermal admittance spectroscopy; XPS
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.81, no.1, pp.54 - 58
Indexed
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
Volume
81
Number
1
Start Page
54
End Page
58
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/142928
DOI
10.1007/s40042-022-00511-0
ISSN
0374-4884
Abstract
The optoelectronic devices based on colloidal lead sulfide quantum dots (PbS QDs) have suffered from electronic trap states in bandgap. The trap state is a source for accelerating carrier recombination and degrading the performance of optoelectronic devices. Here, we treated PbS QD electrochemically using cyclic voltammetry to modulate the density of trap states. The reduction of the trap density in the QD layer after electrochemical treatment was confirmed by the impedance analyzing technique, the thermal admittance spectroscopy. The XPS spectra showed that the QD films are oxidized after the electrochemical treatment, implying that the oxidation of the QD surface regulated the trap density through the electrochemical treatment.
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