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Surface Characterization of Multi-Layer Al2O3 / ZnO Thin Film Deposited on Transparent Polyimide Film Using Atomic Layer DepositionSurface Characterization of Multi-Layer Al2O3 / ZnO Thin Film Deposited on Transparent Polyimide Film Using Atomic Layer Deposition

Alternative Title
Surface Characterization of Multi-Layer Al2O3 / ZnO Thin Film Deposited on Transparent Polyimide Film Using Atomic Layer Deposition
Authors
Byoung-Ho Choi
Issue Date
25-7월-2016
Publisher
American Vacuum Society
Citation
16th International Conference on Atomic Layer Deposition
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/28241
Conference Name
16th International Conference on Atomic Layer Deposition
Place
IE
Conference Date
2016-07-24
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College of Engineering > Department of Mechanical Engineering > 2. Conference Papers

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공과대학 (기계공학부)
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