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Valid Data Acquisition for Patent AnalysisValid Data Acquisition for Patent Analysis
- Alternative Title
- Valid Data Acquisition for Patent Analysis
- Authors
- Park Sang Sung
- Issue Date
- 29-6월-2016
- Publisher
- Korean Institute of Industrial Engineers & Korea Industrial and Systems Engineering
- Citation
- The 26th International Conference on Flexible Automation & Intelligent Manufacturing
- Conference Name
- The 26th International Conference on Flexible Automation & Intelligent Manufacturing
- Place
- KO
- Conference Date
- 2016-06-27
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Collections - Graduate School > Graduate School of management of technology > 2. Conference Papers
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