Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Solid-state quantum defects and scanning probe microscopySolid-state quantum defects and scanning probe microscopy
- Alternative Title
- Solid-state quantum defects and scanning probe microscopy
- Authors
- Donghun Lee
- Issue Date
- 10-3월-2016
- Publisher
- EMN
- Citation
- EMN international conference
- Conference Name
- EMN international conference
- Place
- CH
- Conference Date
- 2016-03-08
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Science > Department of Physics > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.