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디스플레이 패널상의 얼룩 불량 분류를 위한 새로운 특징 추출 방법A new feature extraction method for mura defect classification
- Alternative Title
- A new feature extraction method for mura defect classification
- Authors
- Ko, Sungjea
- Issue Date
- 23-11월-2013
- Publisher
- 대한전자공학회
- Citation
- 대한전자공학회 추계학술대회
- Conference Name
- 대한전자공학회 추계학술대회
- Place
- KO
- Conference Date
- 2013-11-23
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Collections - College of Engineering > School of Electrical Engineering > 2. Conference Papers
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