Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Measuring quantitative temperature profile across the multiple quantum wll of an operating light-emitting diodeMeasuring quantitative temperature profile across the multiple quantum wll of an operating light-emitting diode
- Alternative Title
- Measuring quantitative temperature profile across the multiple quantum wll of an operating light-emitting diode
- Authors
- KWON, Oh Myoung
- Issue Date
- 10-7월-2013
- Publisher
- GRESPI
- Citation
- Quantitative Micro and Nano Thermal imaging and analysis 2013
- Conference Name
- Quantitative Micro and Nano Thermal imaging and analysis 2013
- Place
- FR
Reims
- Conference Date
- 2013-07-10
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > Department of Mechanical Engineering > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.