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다중 식별자를 이용한 Adversarial Autoencoder 기반 제조 공정 이상 탐지다중 식별자를 이용한 Adversarial Autoencoder 기반 제조 공정 이상 탐지

Alternative Title
다중 식별자를 이용한 Adversarial Autoencoder 기반 제조 공정 이상 탐지
Authors
Jun-Geol Baek
Issue Date
13-11월-2020
Publisher
대한산업공학회
Citation
2020 대한산업공학회 추계학술대회
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/4489
Conference Name
2020 대한산업공학회 추계학술대회
Place
KO
서울과학기술대학교
Conference Date
2020-11-13
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College of Engineering > School of Industrial and Management Engineering > 2. Conference Papers

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Baek, Jun Geol
공과대학 (산업경영공학부)
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