Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Comparison of the Properties of GaN Film Grown on Patterned Sapphire Substrate with Different Pattern DesignsComparison of the Properties of GaN Film Grown on Patterned Sapphire Substrate with Different Pattern Designs
- Alternative Title
- Comparison of the Properties of GaN Film Grown on Patterned Sapphire Substrate with Different Pattern Designs
- Authors
- BYUN, Dong Jin
- Issue Date
- 15-10월-2012
- Publisher
- International Workshop on Nitride Semiconductors
- Citation
- International Workshop on Nitride Semiconductors 2012
- Conference Name
- International Workshop on Nitride Semiconductors 2012
- Place
- JA
- Conference Date
- 2012-10-14
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.