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Bifunctional nanoparticulated nickel ferrite thin films: Resistive memory and aqueous battery applications

Authors
Dongale, Tukaram D.Khot, Sagar S.Patil, Akshay A.Wagh, Siddhesh V.Patil, Prashant B.Dubal, Deepak P.Kim, Tae Geun
Issue Date
Mar-2021
Publisher
ELSEVIER SCI LTD
Keywords
Data storage materials; Energy storage materials; Resistive switching; Memristive device; Aqueous battery; Nickel ferrite
Citation
MATERIALS & DESIGN, v.201
Indexed
SCIE
SCOPUS
Journal Title
MATERIALS & DESIGN
Volume
201
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/49532
DOI
10.1016/j.matdes.2021.109493
ISSN
0264-1275
Abstract
Herein, excellent non-volatile memory and aqueous battery properties of solution-processable nickel ferrite (NFO) nanomaterial were demonstrated. In the case of non-volatile memory property, the device operates on +/- 2 V resistive switching voltage and shows double valued charge-magnetic flux characteristics. Excellent endurance (10(3)) and retention (10(4) s) non-volatile memory properties with a good memory window (10(3)) were observed for NFO memristive device. The conduction and resistive switching mechanisms based on experimental data are provided. Furthermore, the present work investigates the electrochemical performance of the NFO thin film electrode in the different electrolytes (viz. Na2SO4, Li2SO4, and Na2SO4: Li2SO4). It was revealed that the NFO thin film shows improved electrochemical performance in Na2SO4 electrolyte with a high specific capacity of 18.56 mAh/g at 1 mA/cm(2) current density. The electrochemical impedance spectroscopic results reveal that the NFO thin film electrode shows low series and charge transfer resistance values for Na2SO4 electrolyte than other electrolytes. The diffusion coefficient of different ions (DNa+, DLi+ and DNa+:Li+) were found to be 9.975 x 10(-10) cm(2) s(-1), 3.292 x 10(-11) cm(2) s(-1), 2 x 10(-10) cm(2) s(-1), respectively. A high diffusion coefficient was found for Na+ ions, indicating rapid Na+ transport with NFO thin-film electrodes (C) 2021 The Author(s). Published by Elsevier Ltd.
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