ASPICEmodel of p-channel silicon tunneling field-effect transistors for logic applications
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Woo, Sola | - |
dc.contributor.author | Jeon, Juhee | - |
dc.contributor.author | Kim, Sangsig | - |
dc.date.accessioned | 2021-08-30T05:05:46Z | - |
dc.date.available | 2021-08-30T05:05:46Z | - |
dc.date.created | 2021-06-18 | - |
dc.date.issued | 2021-01 | - |
dc.identifier.issn | 0894-3370 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/50636 | - |
dc.description.abstract | In this study, we propose a SPICE model ofp-channel silicon tunneling field-effect transistors (TFETs) for logic applications. To verify our model, electrical characteristics of fabricatedp-TFETs are calibrated by utilizing TCAD and SPICE simulations. We simulate various logic gates, such as complementary TFET (c-TFET) inverters,c-TFET NAND gates, andc-TFET NOR gates using our TFET model. Our simulation shows that ac-TFET inverter can be operated atV(DD)as low as 0.3 V and thatc-TFET logic gates based on our model can operate similar to 1000 times higher frequency than conventional TFET logic gates. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | WILEY | - |
dc.subject | DRAIN CURRENT MODEL | - |
dc.subject | GATE | - |
dc.subject | FETS | - |
dc.subject | MOSFETS | - |
dc.subject | SI | - |
dc.title | ASPICEmodel of p-channel silicon tunneling field-effect transistors for logic applications | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Sangsig | - |
dc.identifier.doi | 10.1002/jnm.2793 | - |
dc.identifier.scopusid | 2-s2.0-85089065373 | - |
dc.identifier.wosid | 000556132600001 | - |
dc.identifier.bibliographicCitation | INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, v.34, no.1 | - |
dc.relation.isPartOf | INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS | - |
dc.citation.title | INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS | - |
dc.citation.volume | 34 | - |
dc.citation.number | 1 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Mathematics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Mathematics, Interdisciplinary Applications | - |
dc.subject.keywordPlus | DRAIN CURRENT MODEL | - |
dc.subject.keywordPlus | GATE | - |
dc.subject.keywordPlus | FETS | - |
dc.subject.keywordPlus | MOSFETS | - |
dc.subject.keywordPlus | SI | - |
dc.subject.keywordAuthor | device modeling | - |
dc.subject.keywordAuthor | SPICE model | - |
dc.subject.keywordAuthor | TCAD simulation | - |
dc.subject.keywordAuthor | tunnel FET | - |
dc.subject.keywordAuthor | tunnel FET logic gate | - |
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