Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

ASPICEmodel of p-channel silicon tunneling field-effect transistors for logic applications

Full metadata record
DC Field Value Language
dc.contributor.authorWoo, Sola-
dc.contributor.authorJeon, Juhee-
dc.contributor.authorKim, Sangsig-
dc.date.accessioned2021-08-30T05:05:46Z-
dc.date.available2021-08-30T05:05:46Z-
dc.date.created2021-06-18-
dc.date.issued2021-01-
dc.identifier.issn0894-3370-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/50636-
dc.description.abstractIn this study, we propose a SPICE model ofp-channel silicon tunneling field-effect transistors (TFETs) for logic applications. To verify our model, electrical characteristics of fabricatedp-TFETs are calibrated by utilizing TCAD and SPICE simulations. We simulate various logic gates, such as complementary TFET (c-TFET) inverters,c-TFET NAND gates, andc-TFET NOR gates using our TFET model. Our simulation shows that ac-TFET inverter can be operated atV(DD)as low as 0.3 V and thatc-TFET logic gates based on our model can operate similar to 1000 times higher frequency than conventional TFET logic gates.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherWILEY-
dc.subjectDRAIN CURRENT MODEL-
dc.subjectGATE-
dc.subjectFETS-
dc.subjectMOSFETS-
dc.subjectSI-
dc.titleASPICEmodel of p-channel silicon tunneling field-effect transistors for logic applications-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Sangsig-
dc.identifier.doi10.1002/jnm.2793-
dc.identifier.scopusid2-s2.0-85089065373-
dc.identifier.wosid000556132600001-
dc.identifier.bibliographicCitationINTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, v.34, no.1-
dc.relation.isPartOfINTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS-
dc.citation.titleINTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS-
dc.citation.volume34-
dc.citation.number1-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaMathematics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryMathematics, Interdisciplinary Applications-
dc.subject.keywordPlusDRAIN CURRENT MODEL-
dc.subject.keywordPlusGATE-
dc.subject.keywordPlusFETS-
dc.subject.keywordPlusMOSFETS-
dc.subject.keywordPlusSI-
dc.subject.keywordAuthordevice modeling-
dc.subject.keywordAuthorSPICE model-
dc.subject.keywordAuthorTCAD simulation-
dc.subject.keywordAuthortunnel FET-
dc.subject.keywordAuthortunnel FET logic gate-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kim, Sang sig photo

Kim, Sang sig
공과대학 (전기전자공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE