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Effect of Oxygen Ambient on Intrinsic Stress of ZnO Thin Films and Physical Properties for The Channel Layer of Transparent TFTs

Authors
Moon Byung-Moo
Issue Date
20-Feb-2009
Publisher
삼성전자(주)/한국반도체산업협회/한국반도체연구조합
Citation
제16회 한국반도체학술대회
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/51722
Conference Name
제16회 한국반도체학술대회
Place
KO
대전컴벤션센터(DCC)
Conference Date
2009-02-18
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College of Engineering > School of Electrical Engineering > 2. Conference Papers

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