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Micro-light-emitting diode with n-GaN/NiO/Au-based resistive-switching electrode for compact driving circuitry

Authors
Lee, Byeong RyongPark, Ju HyunKim, Tae Geun
Issue Date
15-5월-2020
Publisher
ELSEVIER SCIENCE SA
Keywords
Light-emitting memory; Micro-light-emitting diode display; Resistive random access memory switch; Driving technology; Oxygen vacancy
Citation
JOURNAL OF ALLOYS AND COMPOUNDS, v.823
Indexed
SCIE
SCOPUS
Journal Title
JOURNAL OF ALLOYS AND COMPOUNDS
Volume
823
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/55681
DOI
10.1016/j.jallcom.2020.153762
ISSN
0925-8388
Abstract
Micro-light-emitting diode (mu LED) displays have been receiving great attention due to their out-performance over competitor technologies such as organic LED and liquid crystal displays. However, the transfer of the mu LED chips onto the backplane and their driving technology are technical hurdles for developing future mu LED displays. Here, we introduce a simple method to effectively control each mu LED pixel by using light-emitting memories (LEMs), in the form of mu LEDs with n-GaN/NiO/Au-based resistive switching elements, which have a unipolar switching behavior with good retention (>10(5) s) and acceptably high on/off ratios (10(2)) at an operating voltage of 4 V. The resulting devices optically exhibited higher output powers than typical indium tin oxide-based mu LEDs. In addition, we investigated the switching mechanism of the proposed LEM device using transmission electron microscopy and secondary-ion mass spectroscopy. The proposed method is expected to offer an innovative route for driving future image-storage displays with high resolution. (C) 2020 Elsevier B.V. All rights reserved.
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공과대학 (전기전자공학부)
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