Micro-light-emitting diode with n-GaN/NiO/Au-based resistive-switching electrode for compact driving circuitry
- Authors
- Lee, Byeong Ryong; Park, Ju Hyun; Kim, Tae Geun
- Issue Date
- 15-5월-2020
- Publisher
- ELSEVIER SCIENCE SA
- Keywords
- Light-emitting memory; Micro-light-emitting diode display; Resistive random access memory switch; Driving technology; Oxygen vacancy
- Citation
- JOURNAL OF ALLOYS AND COMPOUNDS, v.823
- Indexed
- SCIE
SCOPUS
- Journal Title
- JOURNAL OF ALLOYS AND COMPOUNDS
- Volume
- 823
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/55681
- DOI
- 10.1016/j.jallcom.2020.153762
- ISSN
- 0925-8388
- Abstract
- Micro-light-emitting diode (mu LED) displays have been receiving great attention due to their out-performance over competitor technologies such as organic LED and liquid crystal displays. However, the transfer of the mu LED chips onto the backplane and their driving technology are technical hurdles for developing future mu LED displays. Here, we introduce a simple method to effectively control each mu LED pixel by using light-emitting memories (LEMs), in the form of mu LEDs with n-GaN/NiO/Au-based resistive switching elements, which have a unipolar switching behavior with good retention (>10(5) s) and acceptably high on/off ratios (10(2)) at an operating voltage of 4 V. The resulting devices optically exhibited higher output powers than typical indium tin oxide-based mu LEDs. In addition, we investigated the switching mechanism of the proposed LEM device using transmission electron microscopy and secondary-ion mass spectroscopy. The proposed method is expected to offer an innovative route for driving future image-storage displays with high resolution. (C) 2020 Elsevier B.V. All rights reserved.
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Collections - College of Engineering > School of Electrical Engineering > 1. Journal Articles
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