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Using SiO2-Based Distributed Bragg Reflector to Improve the Performance of AlGaInP-Based Red Micro-Light Emitting Diode

Authors
Lee, Sang-YoulMoon, Ji HyungMoon, Yong-TaeChoi, ByoungjunOh, Jeong-TakJeong, Hwan-HeeSeong, Tae-YeonAmano, Hiroshi
Issue Date
19-2월-2020
Publisher
ELECTROCHEMICAL SOC INC
Citation
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, v.9, no.3
Indexed
SCIE
SCOPUS
Journal Title
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY
Volume
9
Number
3
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/57620
DOI
10.1149/2162-8777/ab74c3
ISSN
2162-8769
Abstract
We have investigated how different types of the reflectors affected the optical and electrical performance of AlGaInP-based microLEDs. Simulations showed that the AlGaAs-based epitaxial distributed Bragg reflector (DBR) had a stopband at the 610-624 nm region with reflectivity of 90%, the SiO2/TiO2 dielectric DBR gave a stopband at the 580-770 nm range with a maximum reflectivity of 99%, and the ITO/Ag metal reflector exhibited reflectivity of 90% across the 400-800 nm region. All micro-LEDs gave forward voltages of 1.895-1.960 V at 20 mu A. The micro-LEDs with the dielectric DBR and metal reflector yielded 31% and 13% higher light output at 20 mu A than that with the epitaxial DBR, respectively. All of the micro-LEDs contained a shoulder peak at approximately 615 nm in their electroluminescence spectra. Ray-tracing simulations exhibited that the micro-LEDs with the dielectric DBR and metal reflector produced 26% and 22% higher total light output power than the one with the epitaxial DBR, respectively. It was also shown that for the micro-LEDs with the metal reflector, some of the micro-LEDs were detached from the metal reflectors due to the interfacial voids induced as a result of agglomeration of Ag layer during fabrication process. (C) 2020 The Electrochemical Society ("ECS"). Published on behalf of ECS by IOP Publishing Limited.
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공과대학 (신소재공학부)
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