Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

A numerical model to simulate ductile tearing-creep crack growth interaction

Authors
Oh, Young-RyunKim, Seung-JaeKim, Yun-JaeAinsworth, Robert A.Nikbin, Kamran
Issue Date
8월-2019
Publisher
ELSEVIER SCI LTD
Keywords
Creep damage; Creep crack growth; Plastic damage; Ductility damage model; Strain rate effect
Citation
INTERNATIONAL JOURNAL OF PRESSURE VESSELS AND PIPING, v.175
Indexed
SCIE
SCOPUS
Journal Title
INTERNATIONAL JOURNAL OF PRESSURE VESSELS AND PIPING
Volume
175
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/63677
DOI
10.1016/j.ijpvp.2019.103920
ISSN
0308-0161
Abstract
Ductile tearing and creep crack growth are generally treated independently but there are situations in which they can occur simultaneously. First, creep crack growth calculations in components are often continued to large defect sizes in order to determine when limiting conditions for short-term fracture are reached. Secondly, in order to obtain data in reasonable timescales, experimental creep crack growth tests are often performed at high loads such that plasticity occurs in the tests, particularly as the crack grows to larger sizes. This paper presents a numerical model to simulate the interaction of ductile tearing and creep crack growth to address such cases. A strain-based damage model is introduced with total damage assumed to be the linear summation of creep and plastic damage. The model is applied to Type 316H stainless steel at 550 degrees C with the parameters in the damage model determined from tensile, creep and fracture toughness test data. Predictions using the proposed model are then compared with notched creep tensile and creep crack growth test results and shown to be in good agreement with experimental measurements of creep deformation and crack growth.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Department of Mechanical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kim, Yun Jae photo

Kim, Yun Jae
공과대학 (기계공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE