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ITO/AlN rod-based hybrid electrodes: effect of buffer layers in AlN rods on performance of 365-nm light-emitting diodes

Authors
Kim, Kyeong HeonLee, Tae HoSon, Kyung RockKim, Tae Geun
Issue Date
31-May-2019
Publisher
ELSEVIER SCIENCE BV
Keywords
Ultraviolet light-emitting diodes; Conducting filaments; Electrical breakdown; Transparent conductive electrodes
Citation
APPLIED SURFACE SCIENCE, v.477, pp.172 - 178
Indexed
SCIE
SCOPUS
Journal Title
APPLIED SURFACE SCIENCE
Volume
477
Start Page
172
End Page
178
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/65351
DOI
10.1016/j.apsusc.2017.11.015
ISSN
0169-4332
Abstract
In this study, hybrid electrodes consisting of AlN rod arrays and surrounding indium tin oxide (ITO) films are proposed, and the effect of buffer layers in AlN rods on the performance of 365-nm light-emitting diodes (LEDs) is investigated. The AlN rod arrays were introduced in the form of ITO/AlN/buffer layers (Cr/Ni or thin ITO) to reduce the area and voltage for electrical breakdown (EBD), which is used to form conductive channels. The surrounding ITO film was used as a current spreading layer. Using this electrode design, we observed improved ohmic behavior and a higher transmittance at 365 nm compared to those of the reference ITO. In addition, both conduction and ohmic conduction mechanisms in the structure comprising a metal, AlN rod film, and p-AlGaN surface were investigated using various analysis tools. As a result, the 365-nm LEDs with thin Cr/Ni buffer layers exhibited a significantly higher light output power, lower forward voltages, and lower leakage currents than the LEDs with thin ITO buffer layers and reference ITOs. (c) 2017 Elsevier B.V. All rights reserved.
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